Scanning-probe techniques or apparatus; applications of scanning – Particular type of scanning probe microscopy or microscope;... – Atomic force microscopy or apparatus therefor – e.g. – afm probes
Reexamination Certificate
2004-05-07
2010-02-02
Noland, Thomas P (Department: 2856)
Scanning-probe techniques or apparatus; applications of scanning
Particular type of scanning probe microscopy or microscope;...
Atomic force microscopy or apparatus therefor, e.g., afm probes
C073S105000, C850S063000
Reexamination Certificate
active
07657947
ABSTRACT:
A method for exciting free torsional vibrations a spring cantilever, which is clamped in on one side and has a longitudinal extension, of an atomic force microscope (AFM) is disclosed. The invention providesby the one-sidedly clamped-in spring cantilever being placed at a distance over a surface between which and the spring cantilever there is an acoustic coupling medium, by the surface being set into oscillations which are oriented laterally to the surface and are polarized linearly along an oscillation direction, andby the polarization axis given by the oscillation direction being oriented perpendicular to the longitudinal extension of the spring cantilever.
REFERENCES:
patent: 3001439 (1961-09-01), Rouy
patent: 5266896 (1993-11-01), Rugar et al.
patent: 5436448 (1995-07-01), Hosaka et al.
patent: 5459939 (1995-10-01), Kubo et al.
patent: 5656809 (1997-08-01), Miyashita et al.
patent: 5723775 (1998-03-01), Watanabe et al.
patent: 5777977 (1998-07-01), Fujiwara et al.
patent: 5804708 (1998-09-01), Yamanaka et al.
patent: 5852233 (1998-12-01), Arnold et al.
patent: 5880360 (1999-03-01), Hu et al.
patent: 6330824 (2001-12-01), Erie et al.
patent: 6349591 (2002-02-01), Fretigny et al.
patent: 7360404 (2008-04-01), Reinstadtler et al.
patent: 43 24 983 (1995-02-01), None
patent: WO 2004018963 (2004-03-01), None
Rabe et al., “Vibrations of free and surface-coupled atomic force microscope cantilevers: Theory and experiment”, Sep. 1996, Review of Scientific Instruments, vol. 67, Issue 9, pp. 3281-3293.
Kawagishi, T. et al: “Mapping of lateral vibration of the tip in atomic force microscopy at the torsional resonance of the cantilever”, Ultramicroscopy Elsevier Netherlands, vol. 91, No. 1-4, May 2002, pp. 37-48, XP002294882 ISSN: 0304-3991.
Degertekin, F. L, et al: “Actuation and characterization of atomic force microscope cantilevers in fluids by acoustic radiation pressure”, Applied Physics Letters, American Institute of Physics, New York, US, vol. 78, No. 11, Mar. 12, 2001, pp. 1628-1630, XP012027544, ISSN: 003-6951.
Scherer, V., et al: Local elasticity and lubrication measurements using atomic force and friction force microscopy at ultrasonic frequencies, IEEE Transactions on Magnetics, IEEE Inc., New York, US, vol. 33, No. 5, Pt2, Apr. 1, 1997, pp. 4077-4079, XP001104010 ISSN: 0018-9464.
Nakano, S. et al: “Evaluation of the elastic properties of a cantilever using resonant frequencies”, Japanese Journal of Applied Physics, Part 1 (Regular Papers, Short Notes & Review Papers) Publication Office, Japanese Journal Appl. Phys. Japan, vol. 36, No. 58, May 30, 1997, pp. 3265-3266, XP002294883, ISSN: 0021-4922.
Arnold Walter
Reinstädtler Michael
Scherer Volker
Antonelli, Terry Stout & Kraus, LLP.
Fraunhofer-Gesellschaft zur Förderung
Noland Thomas P
LandOfFree
Method and device for the contactless excitation of... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for the contactless excitation of..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for the contactless excitation of... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4165845