Method and device for testing semiconductor laser

Details Method and device for testing semiconductor laser Method and device for testing semiconductor laser

2006-07-11

2006-07-11

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S076220, C702S076000, C372S096000

Reexamination Certificate

active

07075324

ABSTRACT:
In testing a distributed feedback semiconductor laser with a grating having a phase shift part, a spectrum of the distributed feedback semiconductor laser is measured. A difference between an intensity of a side mode at a high-frequency-wave side of a main mode and an intensity of a side mode at a low-frequency-wave side of the main mode is calculated. The distributed feedback semiconductor laser is judged non-defective when the difference is more than a certain value.

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Huang, Y. et al., “Isolator-Free 2.5-Gb's 80-km Transmission by Directly Modulated λ/8 Phase-Shifted DFB-LDs Under Negative Feedback Effect of Mirror Loss”, IEEE Photonics Technology Letters, vol. 13, No. 3, Mar. 2001, pp. 245-247.
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Huang, Y et al., “Isolator-Free 2.5-Gb's 80-sm Transmission by Directly Modulated λ/8 Phase-Shifted DFB-LDs Under Negative Feedback Effect of Mirror Loss”, IEEE Photonics Technology Letters, vol. 13, No. 3, Mar. 2001, pp. 245-247.

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