Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – For fault location
Patent
1994-04-26
1996-05-28
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
For fault location
324718, 324713, 324771, 324537, G01R 3108
Patent
active
055215114
ABSTRACT:
A test method whereby a high current is supplied to a first pin of an integrated device to be tested, and the variation in the voltage drop between the first pin and a second pin on the device to be tested is determined; the two pins being connected to two pads in turn connected, inside the device to be tested, by a low-voltage-drop path. The variation in the voltage drop of the device to be tested is compared with the measured nominal variation of an undoubtedly sound device of the same type, to determine any excessive deviation indicative of deficiency. The supply current in fact results in power dissipation, local heating and, consequently, a variation in the resistance of the connecting wires or of the die attachment to the lead frame, the extent of which differs according to whether only one or both of the wires of a two-wire connection to be tested are present, and according to whether the die is attached properly, poorly or badly to the lead frame. This variation in resistance is reflected in the amount or speed by which the detected voltage drop varies, thus enabling sound parts to be distinguished from faulty ones.
REFERENCES:
patent: 5166627 (1992-11-01), Kitka et al.
patent: 5171091 (1992-12-01), Kruger et al.
patent: 5351010 (1994-09-01), Leopold et al.
Avenia Giovanni
Lanzi Adriano
Pagani Elia
Driscoll David M.
Khosravi Kourosh Cyrus
Morris James H.
SGS--Thomson Microelectronics S.r.l.
Wieder Kenneth A.
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