Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-02-15
2005-02-15
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06856157
ABSTRACT:
The present invention provides a new electronic circuit board and a method of using such board to test electronic devices at elevated temperatures. The board comprises a steel base having a dielectric coating layer and a circuit formed on the layer. The circuit includes a connector region for attachment to an external electrical source and a mounting region for mounting sockets for supporting, powering and monitoring the electronic devices during elevated temperature testing. The board displays a leakage current of less than 10 μAmps at 350° C.
REFERENCES:
patent: 3408565 (1968-10-01), Frick et al.
patent: 3979671 (1976-09-01), Meeker et al.
patent: 4374317 (1983-02-01), Bradshaw
patent: 4568277 (1986-02-01), MacInnes et al.
patent: 4683424 (1987-07-01), Cutright et al.
patent: 4777434 (1988-10-01), Miller et al.
patent: 5073814 (1991-12-01), Cole, Jr. et al.
patent: 5126656 (1992-06-01), Jones
patent: 5329093 (1994-07-01), Okano
patent: 5554965 (1996-09-01), Sundberg
patent: 5555422 (1996-09-01), Nakano
patent: 5659245 (1997-08-01), Ping et al.
patent: 5946546 (1999-08-01), Fillion et al.
patent: 6027354 (2000-02-01), Bowers et al.
patent: 6097200 (2000-08-01), Turlapaty et al.
patent: 6137072 (2000-10-01), Martter et al.
patent: 6195881 (2001-03-01), Giardina et al.
patent: WO 03001859 (2003-01-01), None
Deutschlander G. James
Fetscher Brian S.
Giardina Richard N.
Martter Robert H.
Sundberg Craig C.
Heatron, Inc.
Nguyen Vinh P.
Rankin, Hill Porter & Clark LLP
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