Thermal measuring and testing – Thermal testing of a nonthermal quantity
Patent
1994-11-28
1997-07-22
Gutierrez, Diego F. F.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
374137, 374162, 374141, G01N 2520, G01K 114, G01K 306, G01K 1112
Patent
active
056497660
ABSTRACT:
In order to test airflow in a cabinet for electronics equipment, a board which has an array of thermochromic indicators is positioned in the cabinet, hot air is introduced into the cabinet; and a thermographic pattern in the nature of isotherms which may be formed on the board is observed.
REFERENCES:
patent: 2945305 (1960-07-01), Strickler
patent: 3219993 (1965-11-01), Schwertz
patent: 3617374 (1971-11-01), Hodson
patent: 3620889 (1971-11-01), Baltzer
patent: 3889053 (1975-06-01), Lloyd et al.
patent: 4390275 (1983-06-01), Schilf et al.
patent: 4838664 (1989-06-01), Graham
patent: 4891250 (1990-01-01), Weibe et al.
patent: 4945919 (1990-08-01), Hattori
patent: 4952033 (1990-08-01), Davis
IBM Technical Disclosure Bulletin, "Microencapsulated Liquid Crystal Silkscreen for Component-Failure Detection", vol. 32, No. 7, Dec. 1, 1989, pp. 312-314.
Ericsson Review, Ake Malhammar, "Thermal Dimensioning of Air-Cooled Printed Board Assemblies", vol. 70, No. 4, Jan. 1, 1993, pp. 126-131.
Feinwerktechnik & Messtechnik, "Gefahrdete Bauelementeanschlusse auf Leiterplatten aus Epoxidharz spannungsoptisch sichtbar gemacht, vol. 84, No. 7, oct. 1976, pp. 326-330".
Gutierrez Diego F. F.
Vero Electronics Ltd.
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