Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Reissue Patent
2004-06-23
2011-10-04
Manuel, George (Department: 3762)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
Reissue Patent
active
RE042782
ABSTRACT:
An instrument for measuring aberration refraction of an eye is provided, having: a lens system defining an instrument optical axis and an alignment device for aligning the visual axis of the eye with the instrument optical axis. A light source produces a probing beam that is projected through the lens system parallel to the instrument optical axis and is selectably positionable partially off-set from the instrument optical axis for entering the eye parallel to the instrument optical axis at a plurality of locations on the cornea of the eye. A first photodetector measures the position of a first portion of the probing beam light scattered back from the retina of the eye to measure aberration refraction of the eye at a plurality of locations. A second photodetector synchronously measures the position of a second portion of the probing beam light reflected back from the cornea of the eye.
REFERENCES:
patent: 3290927 (1966-12-01), Gambs
patent: 4609287 (1986-09-01), Kohayakawa
patent: 4691716 (1987-09-01), Tanne
patent: 4796989 (1989-01-01), Fukuma et al.
patent: 5148205 (1992-09-01), Guilino et al.
patent: 5214455 (1993-05-01), Penney et al.
patent: 5258791 (1993-11-01), Penney et al.
patent: 5293871 (1994-03-01), Reinstein et al.
patent: 5414478 (1995-05-01), van Galderen
patent: 5418714 (1995-05-01), Sarver
patent: 5581405 (1996-12-01), Meyers et al.
patent: 5589897 (1996-12-01), Sinclair et al.
patent: 5722427 (1998-03-01), Wakil et al.
patent: 5841511 (1998-11-01), D'Souza et al.
patent: 5847804 (1998-12-01), Sarver et al.
patent: 5875019 (1999-02-01), Villani
patent: 5953100 (1999-09-01), Sarver et al.
patent: 6000800 (1999-12-01), Webb et al.
patent: 6082856 (2000-07-01), Dunn et al.
patent: 6234631 (2001-05-01), Sarver et al.
patent: 6382795 (2002-05-01), Lai
patent: 6409345 (2002-06-01), Molebny et al.
patent: 2273528 (1999-12-01), None
patent: 609544 (1979-07-01), None
patent: 98105286 (1998-07-01), None
patent: PCT/US99/23327 (1999-07-01), None
He et al., Measurement of the wave-front aberration of the eye by a fast psychophysical procedure. Opt. Soc. America USA, vol. 15, No. 9, Sep. 1998, pp. 2449-2456, *paragraphs [2.A.1] - [2.A.4], [0005]; figure 1*.
Navarro R et al, Monochromatic aberrations and point-spread functions of the human eye across the visual field; Journal of the Optical Society of Amerca A, Optics and Image Science; vol. 15, No. 9 Sep. 1998, pp. 2522-2529 *p. 2523-2524; figure 1*.
Corneal Topography The State of the Art by James P. Gills, Donald R. Sanders, Spencer P. Thornton, Robert G. Martin, Johnny L. Gayton, Jack T. Holladay—Chapter 5—The EyeSys 2000 Corneal Analysis System by Spencer P. Thornton, M.D. FACS and Joseph Wakil, M.D. MEE.
EyeSys 2000 Corneal Analysis System: The Ultimate in Corneal Topography from the Proven Leader (Brochure). Copyright EyeSys Technologies, Inc., 1995.
EyeSys Vista: Hand-Held Corneal Topographer (Brochure).
Ophthalmic Terminology: Speller and Vocabulary Builder—Third Edition—by Stein, Slatt, and Stein.
Contact Lenses: Update 1—Chapter 4—Corneal Topography by J. James Rowsey and David J. Schanzlin (Copyright 1986 by Little, Brown and Company).
Contact Lenses—Chapter 17—Measurement of Corneal Curvature: Keratometer (Ophthalmometer) by Oliver H. Dabezies, Jr. and Jack T. Holladay (Copyright 1984 by Little, Brown and Company.
A Comprehensive Guide to Fitting Contact Lenses with EyeSys Pro-Fit Contact Lens Fitting Software by Beth A. Soper, C.O.A. (EyeSys System 2000—Version 3.1).
M.S. Smirnov. Measurement and wave aberration of the eye. Biofizika (Biophysics USSR), 6, pp. 687 through 703 (previously pp. 776-794, 1961).
G. Van den Brink. Measurement of the geometrical aberrations of the eye. Vision Res. 2, pp. 233-244, 1962.
N.M. Sergienko. Oftalmologicheskaya optika (Ophthalmic Optics). Moscow, Meditsina, 1991, 142 pages.
R.H, Webb, C.M. Penney, and K.D. Thompson. Measurement of ocular local wavefront distortion with a spatially resolved refractometer. Applied Optics. 31, pp. 3678-3686, 1992.
S.G. El Hage and F. Berny Contribution of the crystalline lens to the spherical aberration of the eye. J. Opt. Soc. Am. 63, pp. 205-211, 1973.
J. Liang, B. Grimm, S. Goelz, and J. F. Bille, Objective measurement of wave aberrations of the human eye with the use of a Hartmann-Shack wave-front sensor. J Opt. Soc. Am. A 11,pp. 1949-1957, 1994.
J. Liang and D.R. Williams. Aberrations and retinal image quality of the normal human eye. J Opt. Soc. Am. A 14, pp. 2873-2883, 1997.
J. Liang, D. R. Williams and D.T. Miller. Supernormal vision and high resolution retinal imaging through adaptive optics, J. Opt. Soc. Am., A 14, pp. 2884-2892, 1997.
T. Seiler, P.J. McDonnell, “Excimer laser photorefractive keratectomy”, Surv. of Ophthalm., 40, pp. 89-118, 1995.
Molebny Sergiy
Molebny Vasyl
Pallikaris Ioannis
Wakil Youssef
Adler Benjamin Aaron
Manuel George
Tracey Technologies, LLC
LandOfFree
Method and device for synchronous mapping of the total... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for synchronous mapping of the total..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for synchronous mapping of the total... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4265695