Optical: systems and elements – Deflection using a moving element – Using a periodically moving element
Reexamination Certificate
2011-05-31
2011-05-31
Cherry, Euncha P (Department: 2872)
Optical: systems and elements
Deflection using a moving element
Using a periodically moving element
Reexamination Certificate
active
07952781
ABSTRACT:
A method of scanning a light beam is disclosed. The method comprises scanning the light beam along a first axis and scanning the light beam along a second axis, such that a functional dependence of the scanning along the first axis is substantially a step-wave, and a functional dependence of the scanning along the second axis is other than a step-wave.
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Erlich Raviv
Natan-Knaz Sivan
Sromin Alexander
Velger Mordekhai
Weiss Yizhar
Cherry Euncha P
Elop Electrooptical Industries Ltd.
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