Method and device for removing a semiconductor wafer from a flat

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means

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438745, 156345, H01L 2100

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059522429

ABSTRACT:
A means for removing a semiconductor wafer from a flat substrate uses a device for removing a semiconductor wafer from a polishing cloth of a double side polishing machine. The method has a liquid being pressed through the substrate against the semiconductor wafer lying on the substrate, such that the semiconductor wafer is lifted up from the substrate by the action of the liquid. Then the wafer is picked up by a pick-up device.

REFERENCES:
patent: 5494862 (1996-02-01), Kato et al.
patent: 5527209 (1996-06-01), Volodarsqy et al.
Patent Abstracts of Japan, vol. 011, No. 344 (M-640) & JP 62 124844 A (Hihi Ltd).
Patent Abstracts of Japan, vol. 097, No. 001 & JP08229807A (Fusiuoshi Mach Corp).

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