Method and device for processing measured values

Measuring and testing – Instrument proving or calibrating – Volume of flow – speed of flow – volume rate of flow – or mass...

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73 2321, 324608, 324 70X, 36457102, G01N 2704, G01D 1800

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active

050072838

ABSTRACT:
In connection with a method and a device for processing measured values, where resistance variations are evaluated as a measure for the variation of the gas concentration to be measured, it is proposed to measure a basic resistance value at least once, preferably repeatedly, by admitting a standard calibration gas, and to store this resistance value and derive therefrom, for each subsequent measurement of the gas component the concentration of which is to be measured, by an arithmetic operation, the ratio between the resulting total resistance value and the momentary basic resistance value, and to evaluate the ratio so obtained for further processing.

REFERENCES:
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patent: 3429178 (1969-02-01), Darbin
patent: 3864628 (1975-02-01), Klass et al.
patent: 4147513 (1979-04-01), Bienkawski et al.
patent: 4151738 (1979-05-01), Hyer et al.
patent: 4156181 (1979-05-01), Tears, Jr.
patent: 4223549 (1980-09-01), Kitzinger
patent: 4321113 (1982-03-01), Granbow et al.
patent: 4326414 (1982-04-01), Torada et al.
patent: 4627269 (1986-12-01), Forster et al.
patent: 4663958 (1987-05-01), Matthiessen
Patent Abstracts of Japan; Grp P367, vol. 9, No. 151, ABS pub. date Jun. 26, 1985 (60-27849).

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