Radiant energy – Ionic separation or analysis – With sample supply means
Reexamination Certificate
2006-11-21
2006-11-21
Wells, Nikita (Department: 2881)
Radiant energy
Ionic separation or analysis
With sample supply means
C250S281000, C250S282000, C250S286000, C250S42300F, C250S424000
Reexamination Certificate
active
07138626
ABSTRACT:
A system for the stand-off detection of trace amounts of analyte materials such as explosives, chemical warfare agents, toxic industrial chemicals, and the like includes an ion source that is operably connected to an ion collection means and to a sensor. The ion source employs a first gas that is passed through an electrical discharge to produce metastable gas molecules as well as charged particles of various kinds. Ions and other charged particles are removed from the first gas which is then reacted with a second gas having a lower ionization potential to obtain reactant ions of relatively uniform energy. The reactant ions are focused and accelerated into a beam that is directed upon a surface, such as luggage or clothing that is being interrogated, to produce analyte ions which are collected and passed into the sensor that is preferably a differential mobility spectrometer.
REFERENCES:
patent: 4789783 (1988-12-01), Cook
patent: 4974648 (1990-12-01), Propst
patent: 6225623 (2001-05-01), Turner et al.
patent: 6495823 (2002-12-01), Miller et al.
patent: 6512224 (2003-01-01), Miller et al.
patent: 6649907 (2003-11-01), Ebeling et al.
patent: 6690004 (2004-02-01), Miller et al.
patent: 6727496 (2004-04-01), Miller et al.
patent: 6744041 (2004-06-01), Sheehan et al.
patent: 6815668 (2004-11-01), Miller et al.
patent: 6818889 (2004-11-01), Sheehan et al.
patent: 6888132 (2005-05-01), Sheehan et al.
patent: 6949741 (2005-09-01), Cody et al.
patent: 2004/0245458 (2004-12-01), Sheehan et al.
patent: 2005/0196871 (2005-09-01), Cody et al.
patent: WO 04/098743 (2004-11-01), None
Chemi-Ionization-Mass Spectrometry Terms, “Chemi-Ionization” [online], Dec. 26, 2005 [retrieved on Apr. 28, 2006], 1 p., Retrieved from the Internet: http://www.msterms.com/wiki/index.php?title=Chemi-Ionization.
Scott, R.P.W., “Gas Chromatography Detectors” [online], Part of the Chrom. Ed. Series, Subsection: Thermal Argon Detector, Copyright 2002-2005 [retrieved on Apr. 28, 2006], 7 pp., Retrieved from the Internet: http://www.chromatography-online.org/GC-Detectors/Thermal-Argon/rs61.html.
Scott, R.P.W., “Gas Chromatography Detectors ” [online ], Part of the Chrom. Ed. Series, Subsection: Macro Argon Detector, Copyright 2002-2005 [retrieved on Apr. 28, 2006], 10 pp., Retrieved from the Internet: http://www.chromatography-online.org/GC-Detectors/Ionization-Detectors/Macro-Argon/rs54.html.
Scott, R.P.W., “Gas Chromatography Detectors” [online], Part of the Chrom Ed. Series, Subsection: Micro Argon Detector, Copyright 2002-2005 [retrieved on May 11, 2006], 6 pp., Retrieved from the Internet: http://www.chromatography-online.org/GC-Detectors/Ionization-Detectors/Micro-Argon/rs59.html.
Scott, R.P.W., “Gas Chromatography Detectors” [online], Part of the Chrom. Ed. Series, Subsection: The Helium Detector, Copyright 2002-2005 [retrieved on Apr. 28, 2006], 8 pp., Retrieved from the Internet: http://www.chromatography-online.org/GC-Detectors/Ionization-Detectors/Helium/rs64.html.
Akishev, Yu et al., “Negative Corona, Glow and Spark Discharges in Ambient Air and Transitions Between Them,”Plasma Sources Sci. Technol., vol. 14, pp. S18-S25 (2005).
Willoughby, Ross C., et al., “Transmission of Ions Through Conductance Pathways from Atmospheric Pressure,”Proceedings of the 52ndASMS Conference on Mass Spectrometry and Allied Topics, Nashville, Tennessee, 2 pp., May 23-27, 2004.
Sheehan, Edward W., et al., “Atmosheric Pressure Focusing,”Proceedings of the 52ndASMS Conference on Mass Spectrometry and Allied Topics, Nashville, Tennessee, 2 pp., May 23-27, 2004.
Bennocci, et al., “I-V Characteristics and Photocurrents of a He Corona Discharge Under Flow Conditions,”J. Phys. D: Appl. Phys., vol. 37, pp. 709-714 (2004).
Bokman, C. Fredrik, “Analytical Aspects of Atmospheric Pressure Ionization in Mass Spectrometry,” Acta Universitatis Upsaliensis,Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, vol. 748, 46 pp., 2002.
Willoughby, R., Sheehan, E., Mitrovich, A., “A Global View of LC/MS,” Global View Publishing, pp. 64-65, 470-471, Copyright 2002.
Hanley, Luke, et al., “Surface Mass Spectrometry of Molecular Species,”Journal of Mass Spectrometry, vol. 34, pp. 705-723 (1999).
Niessen, W.M.A. and van der Greef, J., “Liquid Chromatography-Mass Spectrometry Principles and Applications,” Marcel Dekker, Inc., New York, New York, pp. 339-341, Copyright 1992.
Bruins, A.P., “Mass Spectrometry With Ion Sources Operating at Atmospheric Pressure,”Mass Spectrometry Reviews, vol. 10, pp. 53-77, 1991.
Beres, S.A., et al., “A New Type of Argon Ionisation Detector,”Analyst, vol. 112, pp. 91-95, Jan, 1987.
Lovelock, J.E. and Lipsky, S.R., “Electron Affinity Spectroscopy-A New Method for the Identification of Functional Groups in Chemical Compounds Separated by Gas Chromatrography,”J. Amer. Chem. Soc., vol. 82, pp. 431-433, Jan. 20, 1960.
Lovelock, J.E., “A Sensitive Detector for Gas Chromatrography,”Journal of Chromatography, vol. 1, pp. 35-46, 1958.
Lovelock, J.E., “Measurement of Low Vapour Concentrations by Collision with Excited Rare Gas Atoms,”Nature, vol. 181, pp. 1460-1462, 1958.
“Principles of DC and RF Plasma Spraying” [online], 1 p., Retrieved from the Internet: http://wiv.vdi-bezirksverein.de/HenneVDI.pdf.
Leparoux, et al., “Investigation of Non-Oxide Nanoparticles by RF Induction Plasma Processing-Synthesis, Modelling and In-Situ Monitoring,”EMPA-Thun, Materials Technology, 1 p.
Guimbaud, C., et al., “An APCI Ion Source to Monitor HNO3Under Ambient Air Conditions” [online], 1 p., Retrieved from the Internet: http://Ich.web.psi.ch/pdf/anrepo3/19.pdf.
EAI Corporation
Kilpatrick & Stockton LLP
Wells Nikita
LandOfFree
Method and device for non-contact sampling and detection does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for non-contact sampling and detection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for non-contact sampling and detection will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3697215