Method and device for monitoring a system

Details Method and device for monitoring a system Method and device for monitoring a system

2007-05-29

2007-05-29

Barlow, John (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C600S300000, C382S128000, C345S156000, C715S828000, C715S961000

Reexamination Certificate

active

10565397

ABSTRACT:
The present invention relates to a method for monitoring a system in which a datum-line display (11) is generated on a viewing screen (4) for at least one parameter of the system, comprising a baseline (14) that represents a base value for the parameter concerned, a continuous curve (15) that represents a variation with time of the values of the parameter concerned and is normal with respect to the baseline (14), and a deviation bar (16) that represents the instantaneous deviation between the base value and current parameter value and is normalized with respect to the baseline (14).

REFERENCES:
patent: 4562843 (1986-01-01), Djordjevich et al.
patent: 5772599 (1998-06-01), Nevo et al.
patent: 5819741 (1998-10-01), Karlsson et al.
patent: 6174283 (2001-01-01), Nevo et al.
patent: 6224549 (2001-05-01), Drongelen
patent: 6383136 (2002-05-01), Jordan
patent: WO 02/078540 (2002-10-01), None

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