Geometrical instruments – Gauge – Comparator
Reexamination Certificate
2006-05-09
2006-05-09
Guadalupe, Yaritza (Department: 2859)
Geometrical instruments
Gauge
Comparator
C033S501050, C033S567000, C073S865900
Reexamination Certificate
active
07040032
ABSTRACT:
A go no-go gauge and method for verifying whether a process kit part used within a plasma chamber of a plasma processing tool has accumulated excessive wear or deposits. The gauge includes a component for verifying whether a dimension of a process kit part feature violates a prescribed size tolerance, the violation indicating that the process kit part has accumulated excessive wear or deposits.
REFERENCES:
patent: 1626176 (1927-04-01), Atwood
patent: 2229124 (1941-01-01), Phillips
patent: 2514956 (1950-07-01), Kuebler
patent: 4151652 (1979-05-01), Palma
patent: 4200987 (1980-05-01), Schmitt
patent: 4858330 (1989-08-01), Larsen
patent: 5131158 (1992-07-01), Wong
patent: 5446774 (1995-08-01), Russell et al.
patent: 5471757 (1995-12-01), McDonald
patent: 5516402 (1996-05-01), Sarrine et al.
patent: 5875558 (1999-03-01), Bakke et al.
patent: 6637121 (2003-10-01), Barefoot
patent: 6748667 (2004-06-01), Sevastian
patent: 6904690 (2005-06-01), Bakke et al.
patent: 2004/0045180 (2004-03-01), Barefoot
patent: 2005/0287927 (2005-12-01), Berman et al.
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