Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent
1986-05-23
1988-09-06
Buczinski, Stephen C.
Optics: measuring and testing
Range or remote distance finding
With photodetection
342127, 342145, G01C 308
Patent
active
047688777
ABSTRACT:
A method and device are provided for measuring the propagation time of a wave, wherein a wave is transmitted modulated in amplitude by a modulation signal. The wave reflected by an obstacle is received after a propagation time and the amplitude thereof is detected. The average value of the product of the detected signal and a reference signal is calculated and the delay with respect to the modulation signal is controlled so as to cancel out the average value. The modulation signal and the reference signal comprise a succession of elementary signals chosen so as to allow, in a single measurement, a long propagation time to be determined without ambiguity and with high accuracy.
REFERENCES:
patent: 3263227 (1966-07-01), Ferry et al.
patent: 3619058 (1971-11-01), Hewlett et al.
patent: 3752582 (1973-08-01), Troll et al.
patent: 3778159 (1973-12-01), Hines et al.
patent: 3877813 (1975-04-01), Hayes et al.
patent: 3900259 (1975-08-01), Mott et al.
patent: 4150377 (1979-04-01), Milov et al.
patent: 4229102 (1980-10-01), Wiklund et al.
patent: 4241995 (1980-12-01), Takahama
patent: 4274736 (1981-06-01), Balmer
patent: 4355899 (1982-10-01), Nussmeier
patent: 4413904 (1983-11-01), Hamada et al.
patent: 4443799 (1984-04-01), Rubin
patent: 4533242 (1985-08-01), McLaughlan et al.
Hewlett Packard Journal vol. 31, No. 6, Jun. 1980, pp. 3-11, Palo Alto, US; D. E. Smith: "Electronic Distance Measurement for Industrial and Scientific Applications" FIG. 2; p. 3, L 1-p. 6, line 36.
Hewlett-Packard Journal, vol. 31, No. 9, Sep. 1980, pp. 3-11, Palo Alto, CA, US; A. F. Gort; "A Fully Integrated, Microprocessor-Controlled Total Station".
Margaillan Eric
Torregrosa Michel
Buczinski Stephen C.
Crouzet
Wallace Linda J.
LandOfFree
Method and device for measuring the propagation time of a wave does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for measuring the propagation time of a wave, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for measuring the propagation time of a wave will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1603561