Method and device for measuring the local scattering of an...

Details Method and device for measuring the local scattering of an... Method and device for measuring the local scattering of an...

2011-01-04

2011-01-04

Mai, Huy K (Department: 2873)

Optics: eye examining, vision testing and correcting

Eye examining or testing instrument

Objective type

C351S246000

Reexamination Certificate

active

07862174

ABSTRACT:
A method for measuring, in a given plane, the scattering of an optical system, including:the illumination of the system by a point source emitting a light flux to be transmitted by the system, and including a direct flux component and a flux component scattered by the system;the interception of part of the transmitted flux by a sampler positioned in a plane, the intercepted flux including the direct flux component and a narrow angle of the scattered flux component;the measurement of the intercepted flux by an analyser including an array of microlenses and first image detector, each microlens forming the image of the sampler on the first image detector, the dimensions of the sampler being defined such that the images of the sampler formed by adjacent microlenses present an overlap zone smaller than the projection zone of a microlens on the image detector.

REFERENCES:
patent: 6155684 (2000-12-01), Bille et al.
patent: 6382795 (2002-05-01), Lai
patent: 7255442 (2007-08-01), Bucourt et al.
patent: 2002/0097376 (2002-07-01), Applegate et al.
patent: 2004/0189941 (2004-09-01), Bucourt et al.
patent: 2009/0073384 (2009-03-01), Warden et al.

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