Method and device for measuring temperature using a diffraction

Details Method and device for measuring temperature using a diffraction Method and device for measuring temperature using a diffraction

1982-07-08

1985-06-25

McGraw, Vincent P.

Optics: measuring and testing

Optical pyrometers

374161, G01J 508, G01J 538

Patent

active

045250669

ABSTRACT:
The invention relates to a temperature measuring method and device. The device comprises a diffraction grating raised to the temperature to be measured, a monochromatic light beam source in which the beam is directed on to the grating and means for measuring the angular position of the diffracted beam.
It is used in measuring the temperature of materials immersed in an ionized medium.

REFERENCES:
patent: 3458257 (1969-07-01), Pryor
patent: 3628866 (1971-12-01), Mueller
patent: 4355898 (1982-10-01), Dakin

Affiliated with

Also associated with

Rating

Method and device for measuring temperature using a diffraction does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for measuring temperature using a diffraction , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for measuring temperature using a diffraction will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-552091