Method and device for measuring surface potential distribution

Electricity: measuring and testing – A material property using electrostatic phenomenon

Reexamination Certificate

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C324S456000, C399S048000

Reexamination Certificate

active

11001048

ABSTRACT:
In a surface potential distribution measurement method and device, a sample having a surface with a surface potential distribution is scanned using a charged particle beam in a two-dimensional manner. A detection signal caused by the two-dimensional scanning is obtained to measure the surface potential distribution. Charged particles, other than charged particles of the charged particle beam incident to the sample surface by the two-dimensional scanning, with which components of an incidence velocity vector of the charged particles in a direction perpendicular to the sample surface are reversed, are detected so that a detection signal indicating an intensity according to the detected charged particles is obtained in correspondence with a position on the sample surface.

REFERENCES:
patent: 6150824 (2000-11-01), Mishra et al.
patent: 3-49143 (1991-03-01), None
patent: 11-184188 (1999-07-01), None
patent: 3009179 (1999-12-01), None
patent: 2003-295696 (2003-10-01), None
patent: 2003-305881 (2003-10-01), None
patent: 2004-251800 (2004-09-01), None

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