Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Subjective type
Patent
1987-08-27
1989-04-18
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Subjective type
351246, A61B 302
Patent
active
048221627
ABSTRACT:
A device for detecting localized retinal damage derives focal responses of the retina from the global response of the retina to patterned stimuli in one's visual field. The stimuli comprises a series of patterns which spatially vary according to a function of a family of orthogonal functions. Each pattern also varies temporally either by being flashed before the patient or by being reversed in contrast at a fixed frequency. An electroretinogram (ERG) or magnetoretinogram (MRG) response of the patient's eye to the series of patterns is fed back into a computer generating the patterns. The responses are used by the computer to determine the coefficients of the transform of the function of the retinal response. The computer calculates the inverse transform associated with the orthogonal functions and provides the retinal response as a function of position on the retina. Contrast, intensity and temporal frequency of the patterns are chosen for a linear response of the eye. Color, intensity and temporal frequency may also be chosen to test different retinal functions. A lock-in amplifier provides the computer the signal amplitude and phase lag of the responses. A signal averager provides the computer an improved signal to noise ratio of the responses.
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Feldman Barbara M.
Richardson Robert W.
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