Method and device for measuring reflected optical radiation

Details Method and device for measuring reflected optical radiation Method and device for measuring reflected optical radiation

2008-09-22

2011-10-25

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

Of light reflection

C356S448000

Reexamination Certificate

active

08045169

ABSTRACT:
The present invention provides an optics assembly, a reflectometer, and a diagnostic device for providing quantitative measurement of optical radiation reflected from a sampling area on an assay matrix. The reflectometer includes an optical radiation source and a detector. The optical radiation source and the detector are mounted in a single plane. An optics assembly is configured to direct the illumination from the optical radiation source to the sampling area on the assay matrix and to direct the radiation diffusely reflected from the sampling area to the detector. The optics assembly is positioned over the face of the circuit board having the optical radiation source and detector mounted directly thereto. The present invention also provides a method for determining the presence of one or more selected analytes in a sample employing a plurality of sampling areas on one or more assay matrixes.

REFERENCES:
patent: 3536927 (1970-10-01), Mink et al.
patent: 4219529 (1980-08-01), Tersteeg et al.
patent: 4224032 (1980-09-01), Glover et al.
patent: 4518529 (1985-05-01), Imada et al.
patent: 4676653 (1987-06-01), Strohmeier et al.
patent: 4756619 (1988-07-01), Gerlinger et al.
patent: 4791461 (1988-12-01), Kishimoto et al.
patent: 5064619 (1991-11-01), Finlan
patent: 5078497 (1992-01-01), Borton et al.
patent: 5442435 (1995-08-01), Cooper et al.
patent: 5467778 (1995-11-01), Catt et al.
patent: 5526120 (1996-06-01), Jina et al.
patent: 5701181 (1997-12-01), Boiarski et al.
patent: 5728352 (1998-03-01), Poto et al.
patent: 5814516 (1998-09-01), Vo-Dinh
patent: 5995236 (1999-11-01), Roth et al.
patent: 7141212 (2006-11-01), Catt et al.
patent: 7492461 (2009-02-01), Hebert et al.

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