Electricity: measuring and testing – Magnetic – Magnetic field detection devices
Reexamination Certificate
2005-12-13
2005-12-13
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Magnetic
Magnetic field detection devices
C324S263000, C324S632000
Reexamination Certificate
active
06975111
ABSTRACT:
A conductor is disposed within an area where electric coupling and magnetic coupling take place between the conductor and a device-under-test (DUT) in at least a portion of frequency band width, and the value of composite currents that is outputted in a plurality of directions different from each other against the DUT, is measured. Based on the measured plurality of values of the composite currents, the first electric current due to electric coupling between the DUT and the conductor and the second electric current due to magnetic coupling between the DUT and the conductor are calculated. From these first and second electric current values, electric field intensity and magnetic field intensity are calculated.
REFERENCES:
patent: 3611382 (1971-10-01), Gray
patent: 5231346 (1993-07-01), Gassmann
patent: 5300879 (1994-04-01), Masuda et al.
patent: 5773974 (1998-06-01), Kraz
patent: 5825331 (1998-10-01), Lee
patent: 6114860 (2000-09-01), Yun
Kami, Yoshio et al., “Measurement of Magnetic Near Fields on Printed Circuit Boards by Using a Magnetic Loop Antenna,” The University of Electro-Communications, Chofu-shi, Tokyo, Japan No data.
Yabukami, S., et al., “HF-UHF Band Electromagnetic Measurements Using Multi-Layer Printed Wiring Board,” Research Institute of Electrical Communication, Tohoku University, Sendai, Japan, 1997.
Yabukami, S., et al., “HF-UHF Band Electromagnetic Measurements Using Multi-Layer Printed Wiring Board,” Research Institute of Electrical Communication, Tohoku University, Sendai, Japan, 1997 (English Abstract).
Namba, Akihiro, et al., “Measurement of Near-Field Emission from Printed Circuit Board using Miniature E-Field Probe,” Faculty of Engineering, Okayama University, Okayama, Japan, 1998.
Namba, Akihiro, et al., “Measurement of Near-Field Emission from Prited Circuit Board Using Miniature E-Field Probe,” Faculty of Engineering, Okayama University, Okayama, Japan, 1998 (English Abstract).
Wabuka, Hiroshi, et al., “Estimation of the RF Current a IC Power Terminal Using Magnetic Probe with Multilayer Structure,” Resources and Environment Protection Research Laboratories, NEC Corporation, Kanagawa, Japan, 1998.
Wabuka, Hiroshi, et al., “Estimation of the RF Current at IC Power Terminal Using Magnetic Probe with Multilayer Structure,” Resources and Environment Protection Research Laboratories, NEC Corporation, Kanagawa, Japan, 1998 (English Abstract).
Kurouchi, Toshiaki, et al., “Research of Noise Measurement Technology in Minute Area,” Tochigi Prefectural Government, Tochigi-Pref Industrial Technology Center, Tochigi, Japan, 1994.
Kurouchi, Toshiaki, et al., “Research of Noise Measurement Technology in Minute Area,” Tochigi Prefectural Government, Tochigi-Pref Industrial Technology Center, Tochigi, Japan, 1994 (English Abstract).
Fujita Masakazu
Kazama Satoshi
Shimizu Masayuki
Deb Anjan
Dole Timothy J.
Lowe Hauptman & Berner LLP
Taiyo Yuden Co. Ltd.
LandOfFree
METHOD AND DEVICE FOR MEASURING INTENSITY OF ELECTROMAGNETIC... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with METHOD AND DEVICE FOR MEASURING INTENSITY OF ELECTROMAGNETIC..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and METHOD AND DEVICE FOR MEASURING INTENSITY OF ELECTROMAGNETIC... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3498353