Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type
Patent
1984-07-30
1985-09-10
Bovernick, Rodney B.
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Objective type
A61B 314
Patent
active
045402531
ABSTRACT:
A method and apparatus for measuring eye refraction errors in which a plurality of infrared patterns are projected onto an eye to be measured. The reflected light is directed onto corresponding light sensitive detectors the outputs of which are coupled through bandpass filters, an automatic gain control circuit and an A/D converter to a microprocessor. The microprocessor analyses the digitized outputs calculating refraction powers in accordance with a disclosed nonlinear regression technique. The refraction errors of the eye, along with a reliability coefficient, are calculated in accordance with the thusly determined refraction powers.
REFERENCES:
patent: 3883233 (1975-05-01), Guilino et al.
patent: 3888569 (1975-06-01), Munnerly et al.
patent: 4293199 (1981-10-01), Wada
Aiura Hirochika
Hara Masato
Hoshika Shuji
Ishiai Hideyuki
Nishikawa Yukiyasu
Asahi Kogaku Kogyo Kabushiki Kaisha
Bovernick Rodney B.
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