Method and device for measuring eye refraction errors

Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Objective type

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A61B 314

Patent

active

045402531

ABSTRACT:
A method and apparatus for measuring eye refraction errors in which a plurality of infrared patterns are projected onto an eye to be measured. The reflected light is directed onto corresponding light sensitive detectors the outputs of which are coupled through bandpass filters, an automatic gain control circuit and an A/D converter to a microprocessor. The microprocessor analyses the digitized outputs calculating refraction powers in accordance with a disclosed nonlinear regression technique. The refraction errors of the eye, along with a reliability coefficient, are calculated in accordance with the thusly determined refraction powers.

REFERENCES:
patent: 3883233 (1975-05-01), Guilino et al.
patent: 3888569 (1975-06-01), Munnerly et al.
patent: 4293199 (1981-10-01), Wada

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