Image analysis – Applications – Manufacturing or product inspection
Reexamination Certificate
2011-03-22
2011-03-22
Chawan, Sheela C (Department: 2624)
Image analysis
Applications
Manufacturing or product inspection
C382S100000, C702S029000, C356S336000, C073S861060
Reexamination Certificate
active
07912274
ABSTRACT:
The present invention relates to a method and device for measuring dynamic parameters of particles comprises applying time correlation analysis on fluctuation of the particles with respect to a detection area of a digital picture.
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Nilsson Lennart
Rigler Per
Rigler Rudolf
Biophos AG
Chawan Sheela C
Rothwell Figg Ernst & Manbeck P.C.
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