Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2004-12-30
2009-08-18
Shechtman, Sean P (Department: 2121)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S030000, C700S031000, C700S173000, C700S180000, C703S002000
Reexamination Certificate
active
07577489
ABSTRACT:
A method for optimizing measurement and control of the flatness of a strip of rolled material. A mapping is accomplished by associating to relevant flatness fault types a reference strip model and an actuator space conversion matrix. A device for optimizing measurement and control of the flatness of a strip of rolled material.
REFERENCES:
patent: 3481194 (1969-12-01), Sivilotti et al.
patent: 4400957 (1983-08-01), Carlstedt et al.
patent: 4551805 (1985-11-01), Shimoda et al.
patent: 4700312 (1987-10-01), Kikuma et al.
patent: 4736305 (1988-04-01), Watanabe
patent: 5287433 (1994-02-01), Prunotto et al.
patent: 5535129 (1996-07-01), Keijser
patent: 5583639 (1996-12-01), Rostvall
patent: 5727127 (1998-03-01), Schulze Horn et al.
patent: 6275032 (2001-08-01), Iwata et al.
patent: 6351269 (2002-02-01), Georgiev
patent: 6411862 (2002-06-01), Hazama et al.
patent: 6463352 (2002-10-01), Tadokoro et al.
patent: 1 110 635 (2001-06-01), None
Fodor George
Mikkelsen Christine
ABB AB
Franklin Eric J.
Shechtman Sean P
Venable LLP
LandOfFree
Method and device for measuring, determining and controlling... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for measuring, determining and controlling..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for measuring, determining and controlling... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4072508