Electricity: measuring and testing – Electrolyte properties – Using a battery testing device
Reexamination Certificate
2006-07-11
2006-07-11
Tibbits, Pia (Department: 2838)
Electricity: measuring and testing
Electrolyte properties
Using a battery testing device
Reexamination Certificate
active
07075305
ABSTRACT:
The internal resistance related value which is related to the internal resistance of a secondary battery is compared with a previously obtained relation between the internal resistance related value and battery condition to judge the battery condition of the secondary battery. Since the internal resistance related value is a value related to the internal resistance which closely depends on the battery condition, the battery condition can be judged in detail based on the above relation. And the internal resistance related value can be obtained more speedily with a predetermined method. On the other hand, when the level of the degradation of a negative electrode is low, an electrolyte is supplemented, and when the level of the degradation of the negative electrode is high, a reducing agent is added to the electrolyte to regenerate the secondary battery. With this regenerating method, the performance of the negative electrode can be recovered without degrading a positive electrode.
REFERENCES:
patent: 4290021 (1981-09-01), Theron et al.
patent: 4342954 (1982-08-01), Griffith
patent: 5204611 (1993-04-01), Nor et al.
patent: 5705929 (1998-01-01), Caravello et al.
patent: 5717336 (1998-02-01), Basell et al.
patent: 5744962 (1998-04-01), Alber et al.
patent: 5773978 (1998-06-01), Becker
patent: 5874168 (1999-02-01), Kiyokawa et al.
patent: 5986435 (1999-11-01), Koenck
patent: 6081098 (2000-06-01), Bertness et al.
patent: 6172505 (2001-01-01), Bertness
patent: 6310481 (2001-10-01), Bertness
patent: 0 905 810 (1999-03-01), None
patent: 53-43842 (1978-04-01), None
patent: 56-126774 (1981-05-01), None
patent: 62-285360 (1987-12-01), None
patent: 7-22073 (1995-01-01), None
patent: 7-29614 (1995-01-01), None
patent: 8-17477 (1996-01-01), None
patent: 8-43506 (1996-02-01), None
patent: 8-43507 (1996-02-01), None
patent: 8-115752 (1996-05-01), None
patent: 8-222279 (1996-08-01), None
patent: 9-045319 (1997-02-01), None
patent: 9-61505 (1997-03-01), None
patent: 09-061505 (1997-03-01), None
patent: 09-084275 (1997-03-01), None
patent: 09-161853 (1997-06-01), None
patent: 9-232005 (1997-09-01), None
patent: 10-56744 (1998-02-01), None
patent: 10-221418 (1998-08-01), None
Ito Takashi
Minohara Taketoshi
Nakamura Kenji
Buchanan & Ingersoll PC
Tibbits Pia
Toyota Jidosha & Kabushiki Kaisha
LandOfFree
Method and device for judging the condition of secondary... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for judging the condition of secondary..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for judging the condition of secondary... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3595988