Method and device for investigation of phase transformations...

Details Method and device for investigation of phase transformations... Method and device for investigation of phase transformations...

2011-03-22

2011-03-22

Verbitsky, Gail (Department: 2855)

Thermal measuring and testing

Differential thermal analysis

C374S102000, C374S001000, C374S032000, C374S016000, C374S011000, C374S012000

Reexamination Certificate

active

07909505

ABSTRACT:
A device and method for investigating phase transformation properties and structural changes of materials. In one form, the device simulates actual thermal processing conditions, while the method can be used in both simulations as well as in actual processing conditions. An analysis using at least one of the device and method is referred to as a single sensor differential thermal analysis, as it compares the temperature recorded in a measured specimen against a reference thermal history without requiring the derivation of the reference thermal history from measured reference temperatures.

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