Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2007-11-19
2011-10-25
Koziol, Stephen (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
C382S154000, C382S285000
Reexamination Certificate
active
08045806
ABSTRACT:
A method and a device determine material interfaces in a test object. The novel method generates three-dimensional image data of the test object or uses already existing three-dimensional image data of the test object. Image values of the image data are, or were, obtained by invasive radiation. An evaluation line for evaluating the image data relative to the test object is determined, a location of a material interface of the test object is determined by evaluating the image data of image values along the evaluation line so that the value of the first partial derivative of the image values in the direction of the evaluation line has a local maximum at the location of the material interface.
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Kunzmann Steffen
Lettenbauer Hubert
Lotze Andreas
Carl Zeiss Industrielle Messtechnik GmbH
Greenberg Laurence A.
Koziol Stephen
Locher Ralph E.
Stemer Werner H.
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