Excavating
Patent
1996-02-01
1997-07-15
Voeltz, Emanuel T.
Excavating
371 221, G01R 313181
Patent
active
056489757
ABSTRACT:
A method and apparatus for selecting test patterns of a plurality of groups of test patterns for testing parts of an integrated circuit. The plurality of groups of test patterns are applied to the parts of the integrated circuit to determine which parts are detected by the plurality of groups of test patterns. The detected parts form a group of parts. Each of the groups of test patterns is selectively identified as either necessary or unnecessary by repeatedly referring to the group of parts. Each time a respective group of test patterns is determined to be necessary, the group of parts is reduced by the parts detected by the respective group of test patterns determined to be necessary. After each of the groups of test patterns has been identified as either necessary or unnecessary, the unnecessary groups of test patterns are eliminated, to form a set of remaining necessary groups of test patterns for testing the integrated circuit.
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Assouad Patrick J.
Fujitsu Limited
Voeltz Emanuel T.
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