Method and device for enabling the measurement of device...

Details Method and device for enabling the measurement of device... Method and device for enabling the measurement of device...

2006-05-31

2009-02-17

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB

Reexamination Certificate

active

07492181

ABSTRACT:
A method for determining an output voltage of a device under test is disclosed. In the method, a first voltage is placed onto a terminal of a resister that is coupled to the device under test and a first current is through the resistor that corresponds to the first voltage is measured. A second voltage is then placed onto the terminal of the resistor and a second current is measured through the resistor that corresponds to the second voltage. An actual resistance of the resistor is computed based on the difference between the first voltage and the second voltage divided by the difference between the first current and the second current. An output voltage of the device under test is calculated based on a magnitude of a measured current through the resistor when the terminal is grounded multiplied by a magnitude of the actual resistance of the resistor.

REFERENCES:
patent: 6255842 (2001-07-01), Hashimoto
patent: 7109736 (2006-09-01), Long
patent: 7256600 (2007-08-01), Walker et al.

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