Method and device for determining the spatial distribution of ch

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

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Details

378 86, A61B 602, G01N 2308

Patent

active

048872857

ABSTRACT:
The invention relates to a method of determining the share of different chemical elements in a layer of an examination zone. The Compton scattered radiation and the Rayleigh scattered radiation are separately determined and the variation of the differential scatter coefficients derived from the measurement values is influenced by the shares of the various chemical elements contained in the individual pixels. Therefore, the share of these chemical elements can be determined therefrom.

REFERENCES:
patent: 3843881 (1974-10-01), Barton, Jr. et al.
patent: 4149081 (1979-04-01), Seppi
patent: 4314155 (1982-02-01), Sowerby

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