X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1987-03-11
1989-12-12
Fields, Carolyn E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 86, A61B 602, G01N 2308
Patent
active
048872857
ABSTRACT:
The invention relates to a method of determining the share of different chemical elements in a layer of an examination zone. The Compton scattered radiation and the Rayleigh scattered radiation are separately determined and the variation of the differential scatter coefficients derived from the measurement values is influenced by the shares of the various chemical elements contained in the individual pixels. Therefore, the share of these chemical elements can be determined therefrom.
REFERENCES:
patent: 3843881 (1974-10-01), Barton, Jr. et al.
patent: 4149081 (1979-04-01), Seppi
patent: 4314155 (1982-02-01), Sowerby
Harding Geoffrey
Kosanetzky Josef-Maria
Fields Carolyn E.
Haken Jack E.
Hynds Joseph A.
U.S. Philips Corporation
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