Method and device for determining the properties of an...

Details Method and device for determining the properties of an... Method and device for determining the properties of an...

2007-11-27

2007-11-27

Chawan, Sheela (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C382S144000, C430S311000, C416S019000, C703S014000

Reexamination Certificate

active

10433250

ABSTRACT:
Process for determination of properties, particularly, the integrity, of an integrated circuit by calculation, wherein a calculation-simulated image of the circuit is compared with a design of the circuit, and deviations between the image and design are detected.

REFERENCES:
patent: 6091845 (2000-07-01), Pierrat et al.

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