Optics: eye examining – vision testing and correcting – Eye examining or testing instrument – Methods of use
Reexamination Certificate
2007-12-04
2007-12-04
Sugarman, Scott J. (Department: 2873)
Optics: eye examining, vision testing and correcting
Eye examining or testing instrument
Methods of use
C351S205000, C351S212000, C351S221000
Reexamination Certificate
active
10714454
ABSTRACT:
A method and an instrument is provided for measuring aberration refraction of an eye with a first device for measuring the total aberration refraction of the eye and a second device for measuring the aberration refraction of the cornea of the eye. The component of aberration refraction caused by the lens caused by the lens is calculated using the measured total eye aberration refraction and the measured component of aberration refraction of the cornea mapped over the optical surfaces of the eye. Each component portion of the aberration refraction provides information usable for making appropriate corrective actions at the cornea, at the lens, or both as indicated by the mapped measurements and calculations.
REFERENCES:
patent: 3290927 (1966-12-01), Gambs
patent: 4190332 (1980-02-01), Body et al.
patent: 4465348 (1984-08-01), Lang et al.
patent: 4609287 (1986-09-01), Kohayakawa
patent: 4691716 (1987-09-01), Tanne
patent: 4778268 (1988-10-01), Randle
patent: 4796989 (1989-01-01), Fukuma et al.
patent: 5148205 (1992-09-01), Guilino et al.
patent: 5258791 (1993-11-01), Penney et al.
patent: 5293871 (1994-03-01), Reinstein et al.
patent: 5414478 (1995-05-01), van Gelderen
patent: 5418714 (1995-05-01), Sarver
patent: 5581405 (1996-12-01), Meyers et al.
patent: 5589897 (1996-12-01), Sinclair et al.
patent: 5722427 (1998-03-01), Wakil et al.
patent: 5841511 (1998-11-01), D'Souza et al.
patent: 5847804 (1998-12-01), Sarver et al.
patent: 5875019 (1999-02-01), Villani
patent: 5953100 (1999-09-01), Sarver et al.
patent: 6000800 (1999-12-01), Webb et al.
patent: 6004313 (1999-12-01), Shimmick et al.
patent: 6082856 (2000-07-01), Dunn et al.
patent: 6199986 (2001-03-01), Williams et al.
patent: 6234631 (2001-05-01), Sarver et al.
patent: 6305802 (2001-10-01), Roffman et al.
patent: 6382795 (2002-05-01), Lai
patent: 6382797 (2002-05-01), Bille et al.
patent: 6409345 (2002-06-01), Molebny et al.
patent: 2003/0011745 (2003-01-01), Molebny et al.
patent: 2003/0142271 (2003-07-01), Ross et al.
patent: 2003/0199858 (2003-10-01), Schelonka
patent: 2273528 (1999-12-01), None
patent: 63242219 (1988-10-01), None
patent: 98105286 (1998-07-01), None
patent: PCT/US99/23327 (1999-07-01), None
Corneal Topography The State of the Art by James P. Gills, Donald R. Sanders, Spencer P. Thornton, Robert G. Martin, Johnny L. Gayton, Jack T. Holladay—Chapter 5—The EyeSys 2000 Corneal Analysis System by Spencer P. Thornton, M.D. Facs and Joseph Wakil, M.D. Mee.
EyeSys 2000 Corneal Analysis System: The Ultimate in Corneal Topography from the Proven Leader (Brochure). Copyright EyeSys Technologies, Inc., 1995.
EyeSys Vista: Hand-Held Corneal Topographer (Brochure).
Ophthalmic Terminology: Speller and Vocabulary Builder—Third Edition—by Stein, Slatt, and Stein.
Contact Lenses: Update 1—Chapter 4—Corneal Topgraphy by J. James Rowsey and David J. Schanzlin (Copyright 1986 by Little, Brouwn and Company).
Contact Lenses—Chapter 17—Measurement of Corneal Curvature: Keratometer (Ophthalmometer) by Oliver H. Dabezies, Jr. and Jack T. Holladay (Copyright 1984 by Little, Brown and Company.
A Comprehensive Guide to Fitting Contact Lenses with EyeSys Pro-Fit Contact Lens Fitting Software by Beth A. Soper, C.O.A. (EyeSys System 2000—Version 3.1).
M.S. Smirnov. Measurement and wave aberration of the eye. Biofizika (Biophysics USSR), 6, pp. 687 through 703 (previously pp. 776-794, 1961). English translation of: p. 690 translation of the last paragraph continuing onto p. 691, and on p. 691 1st, 2ndand 3rdfull paragraphs.
Van de Brink. Measurement of the geometrical aberrations of the eye. Vision Res. 2, pp. 233-244, 1962.
N.M. Sergienko. Oftalmologicheskaya optika (Ophtalmic Optics). Moscow, Meditsina, 1991, 142 pages. English translation of: p. 30-32 text of the last paragraph referring to Figure 19 continuing onto pp. 31 and 32, and first full paragraph of p. 32.
R.H. Webb, C.M. Penney, and K.D. Thompson. Measurement of ocular local wavefront distortion with a spatially resolved refractometer. Applied Optics. 31, pp. 3678-3686, 1992.
S.G. El Hage and Berni F. Contribution of the crystalline lens to the spherical aberration of the eye. J. Opt. Soc. Am. 63, pp. 205-211, 1973.
J. Liang, B. Grimm, S. Goelz, and J. F. Bille, Objective measurement of wave aberrations of the human eye with the use of a Hartmann-Shack wave-front sensor. J Opt. Soc. A. A 11,pp. 1949-1957, 1994.
J. Liang and D.R. Williams. Aberrations and retinal image quality of the normal human eye. J Opt. Soc. Am. A 14, pp. 2873-2883, 1997.
J. Liang, D.R. Williams and D.T. Miller. Supernormal vision and high resolution retinal imaging through adaptive optics, J. Opt. Soc. Am., A 14, pp. 2884-2892, 1997.
T. Seiler, P.J. McDonnell, “Excimer laser photorefractive keratectomy”, Surv. of Ophthalm., 40, pp. 89-118, 1995.
Eye Sys Technologies brochure. EyeSys Software The power that drives high performance corneal topography. EyeSys Technologies Inc., 1995.
W.D. West, OD. Corneal Topography: It's not just for surgeons anymore. Eyecare Technology, Jul./Aug. 1995.
He et al., Measurement of the wave-front aberraton of the eye by a fast psychophysical procedure, Opt. Soc. America USA, vol. 15, No. 9, Sep. 1998, pp. 2449-2456, *paragraphs [2.A.1]-[2.A.4], [0005]; figure 1*.
Navarro R et al., Monochromatic aberrations and point-spread functions of the human eye across the visual field; Journal of the Optical Society of America A, Optics and Image Science; vol. 15, No. 9 Sep. 1998, pp. 2522-2529 *p. 2523-2524; figure 1*.
Molebny Sergiy
Molebny Vasyl
Padrick Tom
Pallikaris Ioannis G.
Wakil Youssef S.
Adler Benjamin Aaron
Sugarman Scott J.
Tracey Technologies, LLC
LandOfFree
Method and device for determining refractive components and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and device for determining refractive components and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for determining refractive components and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3865236