Method and device for determining material properties

Measuring and testing – Surface and cutting edge testing – Roughness

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C073S009000, C850S034000, C850S033000, C850S001000

Reexamination Certificate

active

07810382

ABSTRACT:
The invention relates to a method of determining material properties of a contact formed between a measurement tip of a microscopic probe and a sample surface of a sample material. According to the method, a distance modulation is applied for modulating a distance between a support of the microscopic probe end the sample surface in a direction essentially normal to the sample surface and wherein a normal force signal indicative of a normal force is measured and demodulated. In the method it is proposed that the material properties be determined using measurement data comprised in the demodulated normal force signal and related to a (concave) buckling deformation of the microscopic probe relative to and away from the sample surface.

REFERENCES:
patent: 5481908 (1996-01-01), Gamble
patent: 5503010 (1996-04-01), Yamanaka
patent: 5804708 (1998-09-01), Yamanaka et al.
patent: 6578410 (2003-06-01), Israelachvili
patent: 7302833 (2007-12-01), Sahin et al.
patent: 7584653 (2009-09-01), Su et al.
patent: 7607342 (2009-10-01), Huang et al.
Colchero J. Et al: “Lock-In Technique for Measuring Friction on a Nanometer Scale” Applied Physics Letters, AIP, American Institute of Physics, Melville, NY, US, vol. 68, No. 20, May 13, 1996, pp. 2896-2898, XP000488343, ISSN: 0003-6951.
Mazeran P -E et al: “Normal and lateral modulation with a scanning force microscope, an analysis: Implication in quantitative elastic and friction imaging” Tribology Letters Baltzer Netherlands, vol. 7, No. 4, 1999, pp. 199-212, XP002398003, ISSN: 1023-8883 (ISR).
Maivald P. Et al: “Using force modulation to image surface elasticities with the atomic force microscope” Nanotechnology, Institute of Physics Publishing, Bristol, GB, vol. 2, No. 2, Apr. 1, 1991, pp.103-106, XP020067191, ISSN: 0957-4484 (ISR).
International Search Report for PCT/IB2006/000274.
Written Opinion of the International Searching Authority for PCT/IB2006/000274.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and device for determining material properties does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for determining material properties, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for determining material properties will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4196080

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.