Method and device for determining an operational lifetime of...

Details Method and device for determining an operational lifetime of... Method and device for determining an operational lifetime of...

2007-01-18

2009-11-10

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07616021

ABSTRACT:
An integrated circuit device includes a degradable test structure, a first external interface pin and a second external interface pin, a first conductive path coupling a first node of the degradable test structure and the first external interface pin, and a second conductive path coupling a second node of the degradable test structure and the second external interface pin. Another integrated circuit device includes a non-volatile memory device, a counter comprising an input configured to receive a first clock signal and an output to provide a count value, and control logic configured to store the count value of the counter in the non-volatile memory, whereby the non-volatile memory is externally accessible.

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