Method and device for determining a similarity of measure...

Details Method and device for determining a similarity of measure... Method and device for determining a similarity of measure...

2005-03-15

2005-03-15

Patel, Kanjibhai (Department: 2625)

Image analysis

Pattern recognition

C382S153000, C382S195000

Reexamination Certificate

active

06868181

ABSTRACT:
At least one base element is defined for structures, and surroundings-related information is assigned to each of these base elements. The surroundings-related information characterizes the corresponding base element. A measure of similarity is determined for the structures, the determination being effected in a manner dependent on the base elements and also on the surroundings-related information assigned to the base elements.

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