Method and device for detecting patterns on a substrate

Details Method and device for detecting patterns on a substrate Method and device for detecting patterns on a substrate

2007-07-10

2007-07-10

Richards, N. Drew (Department: 2809)

Optics: measuring and testing

Document pattern analysis or verification

C356S429000, C235S380000, C235S454000

Reexamination Certificate

active

11116526

ABSTRACT:
Device for detecting patterns on a travelling substrate, namely on a substrate being deposited on a sheet or on web matter, wherein the substrate is a metallized foil travelling in a travelling direction. The device comprises a housing for a first incidental beam issued from a first source of light, a second incidental beam issued from a second source of light, an optical measuring system, a photosensitive sensor respectively delivering beams reflected from the substrate and an electronic unit connected to a communication port. The optical measuring system is telecentric, the first incidental beam crosses a telecentric lighting system and the second incidental beam crosses an oblique lighting system.

REFERENCES:
patent: 5225886 (1993-07-01), Koizumi et al.
patent: 5486254 (1996-01-01), Gallagher et al.
patent: 5823692 (1998-10-01), Tolrud et al.
patent: 6291829 (2001-09-01), Allen et al.
European Search Report EP 04 40 5286 dated Oct. 8, 2004.

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