Method and device for detecting metal ions

Details Method and device for detecting metal ions Method and device for detecting metal ions

1982-05-27

1986-05-06

Edlow, Martin H.

357 231, 357 2314, 357 2315, H01L 2966

Patent

active

045875430

ABSTRACT:
A device for detecting metal ions in an atmosphere. The device is based on a well known insulated gate-type field-effect transistor (MOSFET). The device includes a metal ion detecting element based on the MOSFET; a means, connected to the metal ion detecting element, for making a current flow through said metal ion detecting element; and a means, connected to the metal ion detecting element, for detecting the change of the strength of the current flowing through the metal ion detecting element, the change being brought by the electric charge of the metal ions which reached the gate oxide film. A metal ion introducing passage for allowing migration of the metal ions to be detected to the gate oxide film is formed in the gate electrode of the metal ion detecting element in the direction of its thickness.

REFERENCES:
patent: 3438121 (1969-04-01), Wanlass et al.
patent: 3586930 (1971-06-01), Das et al.
patent: 3694673 (1972-09-01), Au
patent: 4158807 (1979-06-01), Senturia
patent: 4218298 (1980-08-01), Shimada
patent: 4332170 (1982-06-01), Belval et al.
patent: 4380168 (1983-04-01), Ibe
patent: 4411741 (1983-10-01), Janata
IEEE Transactions of Biomedical Engineering, Nov. 1974, pp. 485 to 487.
IEEE Transactions of Biomedical Engineering, Sep. 1972, pp. 342 to 351.
Ion-Sensitive Field Effect Transistors, vol. 1, pp. 35-36; 51-53; Pergamon Press Ltd. 1979.
Copy and English Translation of the Official Action.
Sodium-Nak Engineering Handbook, vol. III, Chap. 4, Sec. 6, "Leak Detection", O. J. Foust et al.; 1978.
Journal of Applied Physics, vol. 36, No. 5, "Ion Transport Phenomena in Insulating Films", E. H. Snow et al.; May 1965.

Affiliated with

Also associated with

Rating

Method and device for detecting metal ions does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for detecting metal ions, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for detecting metal ions will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1577620