Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2005-09-20
2005-09-20
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S063000, C702S065000, C322S028000
Reexamination Certificate
active
06947856
ABSTRACT:
Method for detecting a signal, particularly a voltage, for example a battery voltage, having the following steps:measuring the signal and/or the battery voltage at a predefined sampling rate,storing the measured measurement values in a buffer memory, andforming a median value of the stored measurement values in a time-slot pattern slower than the sampling rate to obtain an averaged value.
REFERENCES:
patent: 5079496 (1992-01-01), Pierret et al.
Biester Juergen
Hammel Christof
Kenyon & Kenyon
Robert & Bosch GmbH
Tsai Carol S. W.
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