Method and device for data integrity checking

Details Method and device for data integrity checking Method and device for data integrity checking

2008-05-06

2008-05-06

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

Reexamination Certificate

active

11030728

ABSTRACT:
The present invention relates to high speed datapaths, sometimes including mixed digital and analog voltage signals. In particular, it relates to error checking strategies for large data volumes, in digital and/or analog domains and to analog signal patterns that accelerate charge loading of micromirrors in an SLM. Particular aspects of the present invention are described in the claims, specification and drawings.

REFERENCES:
patent: 4547882 (1985-10-01), Tanner
patent: 5691780 (1997-11-01), Marshall et al.
patent: 5959747 (1999-09-01), Psaltis et al.
patent: 6014128 (2000-01-01), Doherty et al.
patent: 6151074 (2000-11-01), Werner
patent: 6580490 (2003-06-01), Wong et al.
patent: 6618185 (2003-09-01), Sandstrom et al.
patent: 6697316 (2004-02-01), Burr
patent: 6958850 (2005-10-01), Sane et al.
International Search Report of International Application No. PCT/SE 2005/000002, mailed Jul. 7, 20005.

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