Method and device for data integrity checking

Data processing: measuring – calibrating – or testing – Measurement system – Performance or efficiency evaluation

Reexamination Certificate

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Reexamination Certificate

active

11030728

ABSTRACT:
The present invention relates to high speed datapaths, sometimes including mixed digital and analog voltage signals. In particular, it relates to error checking strategies for large data volumes, in digital and/or analog domains and to analog signal patterns that accelerate charge loading of micromirrors in an SLM. Particular aspects of the present invention are described in the claims, specification and drawings.

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patent: 6014128 (2000-01-01), Doherty et al.
patent: 6151074 (2000-11-01), Werner
patent: 6580490 (2003-06-01), Wong et al.
patent: 6618185 (2003-09-01), Sandstrom et al.
patent: 6697316 (2004-02-01), Burr
patent: 6958850 (2005-10-01), Sane et al.
International Search Report of International Application No. PCT/SE 2005/000002, mailed Jul. 7, 20005.

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