Method and device for counting and characterizing defects on a p

Details Method and device for counting and characterizing defects on a p Method and device for counting and characterizing defects on a p

1995-06-08

1997-06-24

Le, Que

Radiant energy

Photocells; circuits and apparatus

With circuit for evaluating a web, strand, strip, or sheet

25055903, 25055946, 356430, G01N 2186

Patent

active

056419716

ABSTRACT:
A method and device for counting and characterizing defects on a photographic support includes inspecting the support with an optical density measuring device. The defects present on the support are then detected, counted and then characterized.

REFERENCES:
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patent: 4252053 (1979-05-01), Menary
patent: 4417149 (1983-11-01), Takeuchi et al.
patent: 4764969 (1988-08-01), Ohtombe et al.
patent: 5278411 (1994-01-01), Popil et al.
patent: 5424555 (1995-06-01), Kimura et al.
Journal of Imaging Science and Technology, vol. 37, No. 2, "Application of Digital Image Analysis Techniques to Photographic Film Defect Test Method Development", Mar./Apr. 1993, Edward Cohen and Ronald Grotovsky, pp. 133-148.

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