Method and device for cooling/heating die during burn in

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S765010

Reexamination Certificate

active

06888363

ABSTRACT:
A system for burn-in testing of integrated circuits employs a cooling module with an aperture that accommodates a standard size holder for various chips, the holder being placed in the mouth of the aperture, in contact with a flexible seal. When the module is raised to make contact from below with a socket on a test board, the seal confines the cooling fluid and contacts on the upper surface of the holder are pressed against a set of corresponding contacts on the test board.

REFERENCES:
patent: 4426619 (1984-01-01), Demand
patent: 4607220 (1986-08-01), Hollman
patent: 4954774 (1990-09-01), Binet
patent: 6184504 (2001-02-01), Cardella
patent: 6191599 (2001-02-01), Stevens

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