Method and device for characterizing osi material

Details Method and device for characterizing osi material Method and device for characterizing osi material

2005-01-31

2009-08-25

Griffin, Walter D (Department: 1797)

Chemistry: analytical and immunological testing

Oxygen containing

C436S136000, C422S078000

Reexamination Certificate

active

07579193

ABSTRACT:
Methods and apparatus for characterising OSI-materials provide for: introducing the material into a measurement cell; subjecting the material to a gas mixture containing oxygen; permitting a certain time or at certain time interval or intervals to elapse; measuring a defined volume part of the gas mixture with regard to its oxygen concentration using a measurement circuit, which together with the time component represents a characterisation of the OSI-material, wherein the OSI-material in the measurement cell is subjected to the gas mixture circulated in a closed reaction circuit, and the defined volume part is conveyed into a measurement circuit containing a gas, for the measurement of the oxygen concentration.

REFERENCES:
patent: 4947339 (1990-08-01), Czekajewski et al.
patent: 5358876 (1994-10-01), Inoue et al.
patent: 5473162 (1995-12-01), Busch et al.
patent: 5906672 (1999-05-01), Michaels et al.
patent: 6455620 (2002-09-01), Cyr et al.
patent: 2002/0068017 (2002-06-01), Naatz et al.
patent: 2003/0082321 (2003-05-01), Kennedy et al.
patent: 2003/0183801 (2003-10-01), Yang et al.
patent: 19528400 (1996-10-01), None
patent: PCT/EP2005/001099 (2005-07-01), None
Rieblinger, Klaus. Quality Advantages, Oxygen-Depleting Packaging Against Undesired Oxidation Reactions, May 2003, Lebensmitteltechnik.Online.DE, pp. 66-67. (Machine Translation, Oct. 2007).

Affiliated with

Also associated with

Rating

Method and device for characterizing osi material does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and device for characterizing osi material, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and device for characterizing osi material will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4111486