Method and device for analyzing circuits

Details Method and device for analyzing circuits Method and device for analyzing circuits

2006-09-19

2006-09-19

Crane, Sara (Department: 2811)

Semiconductor device manufacturing: process

With measuring or testing

C716S030000, C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

07109047

ABSTRACT:
A method of analyzing a circuit comprising a plurality of interconnects is disclosed herein. The method may comprise analyzing at least one electrical property associated with a first interconnect, wherein the first interconnect has at least one first physical dimension. The electrical property may then be stored. A second interconnect having the at least one first physical dimension may then be located and the at least one electrical property is applied to the second interconnect.

REFERENCES:
patent: 5999726 (1999-12-01), Ho
patent: 6013536 (2000-01-01), Nowak et al.
patent: 6266802 (2001-07-01), Malm et al.
patent: 6887791 (2005-05-01), Jung

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