Method and configuration for detecting material defects in...

Details Method and configuration for detecting material defects in... Method and configuration for detecting material defects in...

2008-06-16

2010-02-23

Pham, Hoa Q (Department: 2886)

Optics: measuring and testing

Inspection of flaws or impurities

C356S237200

Reexamination Certificate

active

07667834

ABSTRACT:
A method and a configuration for automatically or visually detecting material defects, in particular cracks, in a workpiece, includes applying a test agent to the workpiece. The test agent contains color pigments which can be excited by using shortwave light. The workpiece is then irradiated with shortwave light from a light source, light emitted by the workpiece is detected by an observer's eye or by a detector, and the signals from the detector are evaluated by an electronic evaluation device in order to determine the material defects. The light source is associated with a first optical interference filter which selects the light emitted by the light source, as a bandpass filter, before the light impinges on the workpiece.

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International Search Report, dated Mar. 15, 2007.

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