Method and circuit for testing memories in integrated circuit fo

Details Method and circuit for testing memories in integrated circuit fo Method and circuit for testing memories in integrated circuit fo

1995-12-21

1997-10-07

Zarabian, A.

Static information storage and retrieval

Floating gate

Particular biasing

365203, 365201, G11C 1134

Patent

active

056755392

ABSTRACT:
An integrated circuit memory that contains a device for the precharging and reading of the bit lines, including a precharging element, a current-voltage converter and a read circuit, further contains a test circuit to isolate the output of the converter from the precharging element and from the read circuit, to apply a test voltage to a cell of the memory through the converter and to measure the current in the cell.

REFERENCES:
patent: 5175705 (1992-12-01), Iwahashi
patent: 5361232 (1994-11-01), Petschauer et al.
patent: 5453954 (1995-09-01), Nakamura

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