Method and circuit for statistical estimation

Details Method and circuit for statistical estimation Method and circuit for statistical estimation

2006-12-12

2006-12-12

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Measured signal processing

Reexamination Certificate

active

07149661

ABSTRACT:
A method for determining a quality indication, such as a bit error rate or a signal to noise ratio, of a photonic signal is described. The photonic signal is sampled, and then an estimated quality indication, such as the bit error rate, is calculated utilizing statisical analysis of the sampled photonic signal.

REFERENCES:
patent: 5870211 (1999-02-01), Yoshida
patent: 6744496 (2004-06-01), Audouin et al.
Optical Bit Error Rate, Stamatious V. Kartalopoulos, ISBN 0-471-61545-5 © 2004 the Institute of Electrical and Electronics Engineers, Chapter 7, pp. 213-248.
Optical Bit Error Rate, Stamatious V. Kartalopoulos, ISBN 0-471-61545-5 © 2004 the Institute of Electrical and Electronics Engineers, Chapter 8, pp. 249-258.

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