Method and circuit for measuring capacitance and capacitance...

Details Method and circuit for measuring capacitance and capacitance... Method and circuit for measuring capacitance and capacitance...

2008-01-29

2008-01-29

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S537000

Reexamination Certificate

active

07323879

ABSTRACT:
A circuit and method for measuring capacitance and capacitance mismatch of at least one capacitor pair are provided. The circuit includes a first switch, a second switch, a third switch and a P-type transistor. A terminal of the first switch is connected to a terminal of a first capacitor, and a terminal of the second switch is connected to a terminal of a second capacitor. A terminal of the third switch is connected to another terminal of the first capacitor and another terminal of the second capacitor, and a gate of the P-type transistor is connected to another terminal of the third switch. When the first, second and third switches are turned on, a capacitance of the first capacitor, a capacitance of the second capacitor, or a capacitance mismatch between the first and second capacitances is measured.

REFERENCES:
patent: 5602487 (1997-02-01), Manku
patent: 2004/0004488 (2004-01-01), Baxter
patent: 2006/0214890 (2006-09-01), Morishige et al.
patent: 1320900 (2001-11-01), None

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