Method and circuit for locating anomalous memory cells

Details Method and circuit for locating anomalous memory cells Method and circuit for locating anomalous memory cells

2006-07-04

2006-07-04

Le, Thong Q. (Department: 2827)

Static information storage and retrieval

Powering

Data preservation

C365S189070

Reexamination Certificate

active

07072239

ABSTRACT:
A method for locating in an array of memory cells a set of cells having a stand-by current that exceeds a certain value based on their programming state. The method includes selecting all the cells of the array of memory cells as a set of cells to be tested, and dividing the set of cells to be tested into subsets of cells, and repeatedly sensing a stand-by current absorbed by the array of memory cells after having changed the programming state of the subsets of cells. The sensed stand-by currents are compared and a subset of cells having a stand-by current exceeding the certain value are identified as a function of the comparison. The identified subset of cells is selected as a new set of cells to be tested, and the method is repeated. Otherwise, the testing stops with the just tested subset of cells having a stand-by current exceeding the certain value.

REFERENCES:
patent: 5835418 (1998-11-01), Harasawa et al.

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