Amplifiers – With amplifier condition indicating or testing means
Reexamination Certificate
2005-08-09
2005-08-09
Nguyen, Patricia (Department: 2817)
Amplifiers
With amplifier condition indicating or testing means
C330S009000, C330S307000
Reexamination Certificate
active
06927624
ABSTRACT:
A method and circuit is provided for improving the control of the trimming procedure for various devices without the need for additional dedicated control pins. Instead, the trimming procedure is controlled through sensing of changes in current and/or voltage applied through the existing available pins or bondpads of the devices to determine whether a command for trim programming has occurred. As a result, package-level trimming of the devices can be conducted in standard device packages having low pin count configurations, such as operational amplifiers, instrumentation amplifiers, difference amplifiers, low drop-out regulators, voltage references and other similar types of devices. A device to be trimmed is configured with internal circuitry configured to sense changes in current and/or voltage in the output or supply voltage of the device, and a test system for applying changes in the current and/or voltage through the existing available pins or bondpads of the devices. The internal circuitry can comprise sensing circuitry comprising one or more internal sensors configured to measure current and/or voltage in the output or supply voltage of the device, and can comprise trim programming circuitry for facilitating trim programming of the device.
REFERENCES:
patent: 5694366 (1997-12-01), Chevallier et al.
patent: 6338032 (2002-01-01), Chen
patent: 6459335 (2002-10-01), Darmawaskita et al.
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Ivanov Vadim V.
Jones David M.
Sanchez Stephen J.
Spady David
Brady W. James
Nguyen Patricia
Swayze, Jr. W. Daniel
Telecky , Jr. Frederick J.
Texas Instruments Incorporated
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