Method and circuit for determining the wave-length of light

Details Method and circuit for determining the wave-length of light Method and circuit for determining the wave-length of light

1986-08-29

1988-06-07

Nelms, David C.

Radiant energy

Photocells; circuits and apparatus

Photocell controlled circuit

250226, H01J 4014, H01J 516, G01J 350

Patent

active

047498510

ABSTRACT:
Method and system for determining the wave-length of light impinging onto the surface of a light sensitive semiconductor structure by determining the photocurrent therethrough. The semiconductor structure consists of a substrate of one conductivity type, an adjoining epitaxial layer of a second conductivity type, and thereon a doped region of the first conductivity type. At least two different reverse voltages are applied across the epitaxial layer and said doped region, creating thereby different depletion zones in the epitaxial layer. Measures are taken for completely depleting the remaining section of the epitaxial layer underneath said depletion zone. For each reverse voltage the photo current is measured and the measured values are supplied through a matrix process combined to obtain a filter response.

REFERENCES:
patent: 3366802 (1968-01-01), Hilbiber
patent: 4264857 (1981-04-01), Jambotkar

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