Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2007-10-25
2010-02-23
Wachsman, Hal D (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C702S182000, C702S118000, C716S030000, C716S030000, C714S724000
Reexamination Certificate
active
07668682
ABSTRACT:
A design structure and method comprising a degradation detection circuit configured to respond to degradation. The degradation detection circuit is located within a semiconductor device and comprises a process sensitive circuit, a measurement circuit, a calculation circuit, and a control circuit. The method comprises subjecting the semiconductor device to a first operating condition. A first value at a first time for a parameter of the process sensitive circuit is measured by the measurement circuit. The semiconductor device is operated to perform an intended function. A second value at a second time for the parameter of the circuit is measured by the measurement circuit. The second time is different from the first time. A first differential value between the first value and the second value is determined by the calculation circuit. The control circuit is configured to receive an enable signal.
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Office Action (Mail Date Mar. 18, 2009) for U.S. Appl. No. 11/463,911, Filing Date Aug. 11, 2006; Confirmation No. 7719.
Notice of Allowance (Mail Date Jun. 1, 2009) for U.S. Appl. No. 11/463,911, Filing Date Aug. 11, 2006; Confirmation No. 7719.
Gonzalez Christopher
Ramadurai Vinod
Rohrer Norman Jay
International Business Machines - Corporation
LeStrange Michael J.
Schmeiser Olsen & Watts
Wachsman Hal D
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