Method and circuit for detecting a fault of semiconductor...

Details Method and circuit for detecting a fault of semiconductor... Method and circuit for detecting a fault of semiconductor...

2006-04-11

2006-04-11

Tsai, Carol S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S057000, C702S058000, C701S034000

Reexamination Certificate

active

07027939

ABSTRACT:
A circuit for detecting a defect of electronic components in an electronic control unit includes an output for driving a load (3). A redundant measurement of the current (IL) is executed at the contacts (G, S, D), in particular at the driven contacts (S, D), of one or more semiconductor circuit elements, and an error function of a semiconductor circuit element is detected when the comparison of two current values (IS, ISense1, ISense2) by way of the current flowing through a load (3, 3′) indicates an unequal current distribution. This circuit is of use in electronic brake force or driving dynamics controllers for motor vehicles.

REFERENCES:
patent: 5041817 (1991-08-01), Reeb
patent: 5079456 (1992-01-01), Kotowski et al.
patent: 5107427 (1992-04-01), Peter et al.
patent: 5166543 (1992-11-01), Schneider et al.
patent: 5237579 (1993-08-01), Ema et al.
patent: 5374857 (1994-12-01), Carobolante
patent: 5438286 (1995-08-01), Pavlin et al.
patent: 5652540 (1997-07-01), Eilley
patent: 5760613 (1998-06-01), Pulvirenti et al.
patent: 5763963 (1998-06-01), Zydek et al.
patent: 5801573 (1998-09-01), Kelly et al.
patent: 5995885 (1999-11-01), Pfeufer et al.
patent: 6169335 (2001-01-01), Horsak et al.
patent: 6226602 (2001-05-01), Schmitt et al.
patent: 6347028 (2002-02-01), Hausman et al.
patent: 6377109 (2002-04-01), Yama
patent: 6382740 (2002-05-01), Peichl et al.
patent: 6545515 (2003-04-01), Takahashi et al.
patent: 2001/0054887 (2001-12-01), Baretich et al.
patent: 2002/0014900 (2002-02-01), Swonger et al.
patent: 2004/0042135 (2004-03-01), Strutt et al.
patent: 4015625 (1990-11-01), None
patent: 4213412 (1992-10-01), None
patent: 4213606 (1992-10-01), None
patent: 4237122 (1994-05-01), None
patent: 19604041 (1997-04-01), None
patent: 19623441 (1998-01-01), None
patent: 19825029 (1998-12-01), None
patent: 19812920 (1999-12-01), None
patent: 19838657 (2000-03-01), None
patent: 19854914 (2000-06-01), None
patent: 19924416 (2000-10-01), None
patent: 10057486 (2001-04-01), None
patent: 0227149 (1992-06-01), None
patent: 0599605 (1994-06-01), None
patent: 1103817 (2001-05-01), None

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